• DocumentCode
    3668110
  • Title

    Spontaneous emission and reflectivity measurements for the characterization of facet-coatings of semiconductor lasers

  • Author

    Shoude Chang;Jiaren Liu;Zhenguo Lu;Daniel Poitras;Pedro Barrios;Philip Poole;Siegfried Janz

  • Author_Institution
    Information and Communications Technologies, National Research Council Canada. Ottawa, Ontario Canada K1A 0R6
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    A new method for measuring the spontaneous emissions and spectral reflectivity of the facet coating of ridge lasers is described and demonstrated. We present results of spectrally-controlled coated quantum-dot laser waveguides.
  • Keywords
    "Optical waveguides","Semiconductor device measurement","Reflectivity","Semiconductor waveguides","Spontaneous emission","Waveguide lasers","Coatings"
  • Publisher
    ieee
  • Conference_Titel
    Photonics North, 2015
  • Type

    conf

  • DOI
    10.1109/PN.2015.7292494
  • Filename
    7292494
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3668110