DocumentCode
3668408
Title
Opto-electrical characteristics of Si-based blocked-impurity-band detector: Experiment and simulation
Author
Xiaodong Wang;Bingbing Wang;Liwei Hou;Wei Xie;Xiaoyao Chen;Ming Pan
Author_Institution
No. 50 Research Institute of China Electronics Technology Group Corporation, 318 Chang He Road, Shanghai, China 200331
fYear
2015
Firstpage
19
Lastpage
20
Abstract
Opto-electrical characteristics of Si-based blocked-impurity-band (BIB) detector are investigated by combing experiment with simulation. The measured black-body response characteristics at different temperature are discussed. The simulated dark current characteristics with different thicknesses of blocking layer are also presented by taking into account impurity-band effects.
Keywords
"Detectors","Anodes","Dark current","Temperature measurement","Impurities","Temperature","Silicon"
Publisher
ieee
Conference_Titel
Numerical Simulation of Optoelectronic Devices (NUSOD), 2015 International Conference on
ISSN
2158-3234
Print_ISBN
978-1-4799-8378-0
Type
conf
DOI
10.1109/NUSOD.2015.7292801
Filename
7292801
Link To Document