DocumentCode
3668456
Title
Fundamental properties of GaN(0001) films grown directly on Gd2 O3 (0001) platforms: Ab initio structural simulations
Author
Kuo-Cheng Liao;Po-Liang Liu;Huan-Chen Wang;Yu-Hsien Wang
Author_Institution
Graduate Institute of Precision Engineering, National Chung Hsing UniversityNCHUTaichung 402, Taiwan
fYear
2015
Firstpage
119
Lastpage
120
Abstract
We present first-principles calculations to study the heterojunction between a wurtzite GaN(0001) film and a hexagonal Gd2O3(0001) substrate. We report that the most favorable Gd2O3(0001) surface is O terminated. Using the work of adhesion of isolated GaN and Gd2O3 slabs, our calculated interface energies suggest that the graphiticlike GaN films are fully relaxed at Gd2O3(0001) platforms, thereby leading to Ga-polarity in the GaN(0001) epitaxial film. Our findings agree with previously reported results.
Keywords
"Gallium nitride","Epitaxial growth","Substrates","Semiconductor device modeling","Semiconductor process modeling","Slabs","Gadolinium"
Publisher
ieee
Conference_Titel
Numerical Simulation of Optoelectronic Devices (NUSOD), 2015 International Conference on
ISSN
2158-3234
Print_ISBN
978-1-4799-8378-0
Type
conf
DOI
10.1109/NUSOD.2015.7292851
Filename
7292851
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