• DocumentCode
    3668456
  • Title

    Fundamental properties of GaN(0001) films grown directly on Gd2O3(0001) platforms: Ab initio structural simulations

  • Author

    Kuo-Cheng Liao;Po-Liang Liu;Huan-Chen Wang;Yu-Hsien Wang

  • Author_Institution
    Graduate Institute of Precision Engineering, National Chung Hsing UniversityNCHUTaichung 402, Taiwan
  • fYear
    2015
  • Firstpage
    119
  • Lastpage
    120
  • Abstract
    We present first-principles calculations to study the heterojunction between a wurtzite GaN(0001) film and a hexagonal Gd2O3(0001) substrate. We report that the most favorable Gd2O3(0001) surface is O terminated. Using the work of adhesion of isolated GaN and Gd2O3 slabs, our calculated interface energies suggest that the graphiticlike GaN films are fully relaxed at Gd2O3(0001) platforms, thereby leading to Ga-polarity in the GaN(0001) epitaxial film. Our findings agree with previously reported results.
  • Keywords
    "Gallium nitride","Epitaxial growth","Substrates","Semiconductor device modeling","Semiconductor process modeling","Slabs","Gadolinium"
  • Publisher
    ieee
  • Conference_Titel
    Numerical Simulation of Optoelectronic Devices (NUSOD), 2015 International Conference on
  • ISSN
    2158-3234
  • Print_ISBN
    978-1-4799-8378-0
  • Type

    conf

  • DOI
    10.1109/NUSOD.2015.7292851
  • Filename
    7292851