DocumentCode :
3668660
Title :
Comparative analysis of wavelet based approaches for reliable removal of ocular artifacts from single channel EEG
Author :
Saleha Khatun;Ruhi Mahajan;Bashir I. Morshed
Author_Institution :
Department of Electrical and Computer Engineering, The University of Memphis, Memphis TN, 38152
fYear :
2015
fDate :
5/1/2015 12:00:00 AM
Firstpage :
335
Lastpage :
340
Abstract :
For biomedical and scientific fields, Electroencephalography (EEG) has turned out to be an important tool to understand, study, and utilize brain functionalities. To fully utilize EEG signals in real-life closed-loop applications, artifacts such as ocular must be removed. Wavelet transform is one of the powerful methods to remove ocular artifacts from single channel EEG devices. In this study, both stationary and discrete wavelet transforms (SWT and DWT, respectively) have been compared with various wavelet basis functions, such as sym3, haar, coif3, and bior4.4 using either universal threshold (UT) or statistical threshold (ST). Different combinations of wavelet transform techniques, mother wavelets, and thresholds are compared to identify an optimum combination for ocular artifact removal. Performance metrics like Correlation Coefficient (CC), Normalized Mean Square Error (NMSE), Time Frequency Analysis, and execution time have been calculated for measuring the effectiveness of each combination. According to CC, DWT+UT combination turned out to be a good option for the ocular artifact removal. However, according to NMSE and time frequency analysis, SWT+ST has generated better performance in keeping neural segments of EEG unaffected. According to the measurement of execution times, DWT+ST is faster compared to other combinations. The study shows that wavelet transform is suitable in artifact removal from single channel EEG data to implement in ambulatory real-time EEG systems.
Keywords :
"Electroencephalography","Discrete wavelet transforms","Time-frequency analysis","Wavelet analysis"
Publisher :
ieee
Conference_Titel :
Electro/Information Technology (EIT), 2015 IEEE International Conference on
Electronic_ISBN :
2154-0373
Type :
conf
DOI :
10.1109/EIT.2015.7293364
Filename :
7293364
Link To Document :
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