• DocumentCode
    3668660
  • Title

    Comparative analysis of wavelet based approaches for reliable removal of ocular artifacts from single channel EEG

  • Author

    Saleha Khatun;Ruhi Mahajan;Bashir I. Morshed

  • Author_Institution
    Department of Electrical and Computer Engineering, The University of Memphis, Memphis TN, 38152
  • fYear
    2015
  • fDate
    5/1/2015 12:00:00 AM
  • Firstpage
    335
  • Lastpage
    340
  • Abstract
    For biomedical and scientific fields, Electroencephalography (EEG) has turned out to be an important tool to understand, study, and utilize brain functionalities. To fully utilize EEG signals in real-life closed-loop applications, artifacts such as ocular must be removed. Wavelet transform is one of the powerful methods to remove ocular artifacts from single channel EEG devices. In this study, both stationary and discrete wavelet transforms (SWT and DWT, respectively) have been compared with various wavelet basis functions, such as sym3, haar, coif3, and bior4.4 using either universal threshold (UT) or statistical threshold (ST). Different combinations of wavelet transform techniques, mother wavelets, and thresholds are compared to identify an optimum combination for ocular artifact removal. Performance metrics like Correlation Coefficient (CC), Normalized Mean Square Error (NMSE), Time Frequency Analysis, and execution time have been calculated for measuring the effectiveness of each combination. According to CC, DWT+UT combination turned out to be a good option for the ocular artifact removal. However, according to NMSE and time frequency analysis, SWT+ST has generated better performance in keeping neural segments of EEG unaffected. According to the measurement of execution times, DWT+ST is faster compared to other combinations. The study shows that wavelet transform is suitable in artifact removal from single channel EEG data to implement in ambulatory real-time EEG systems.
  • Keywords
    "Electroencephalography","Discrete wavelet transforms","Time-frequency analysis","Wavelet analysis"
  • Publisher
    ieee
  • Conference_Titel
    Electro/Information Technology (EIT), 2015 IEEE International Conference on
  • Electronic_ISBN
    2154-0373
  • Type

    conf

  • DOI
    10.1109/EIT.2015.7293364
  • Filename
    7293364