A thresholding technique for differentiation of materials used in remote sensing

This paper introduces a new remote sensing technique based on polarimetric detection principles, aimed at enhancing the discrimination of unresolved materials, Amorphous Silicon and Polysilicon. Some of the polarimetric measurements performed at different angles of incidence (angular rotations) of these materials are presented using backscattered polarimetric signals obtained with a polarimetric system (test bed). A new discrimination technique of these materials based on their angle of rotation has been presented. This technique calculates the rotation angle at which maximum discrimination between these materials is possible using a thresholding method. Based on the initial results, it can be said that maximum discrimination between the materials is possible more at off-axis angles than at the angle of incidence.