Title :
The profilometer for ION beams
Author :
S. Korenev;M. Musienko
Author_Institution :
Siemens Healthcare, 810 Innovation Drive, Knoxville, TN 37932, USA
fDate :
5/1/2015 12:00:00 AM
Abstract :
The concept of a real-time profilometer for ion beam is considered in this paper. The profilometer hardware is based on X-Y collector electrodes and the software based on LabVIEW from National Instruments. The software algorithm allows for statistical analysis and the visualization of beam current distribution. The concept of the profilometer was tested on the isochronous Eclipse Cyclotron produced by Siemens.
Keywords :
"Electrodes","Data acquisition","Instruments","Ion beams","Cyclotrons","Current measurement","Hardware"
Conference_Titel :
Pulsed Power Conference (PPC), 2015 IEEE
Electronic_ISBN :
2158-4923
DOI :
10.1109/PPC.2015.7297008
