Title :
Physical-model-based image processing for feature aided analysis
Author :
J. Smith;Erin Best;Emma Sum;Yasar Guzel;Michael A. Saville;Lorenzo LoMonte;Michael Wicks
Author_Institution :
Department of Electrical Engineering, Wright State University, Fairborn, Ohio 45435 USA
Abstract :
Attributed scattering center models can relate radar measurements to physical target features. This paper summarizes recent signal processing methods for attributing synthetic aperture radar images with emphasis on feature space definition for object recognition. Examples using laboratory measured inverse synthetic aperture radar data and simulated data are provided.
Keywords :
"Scattering","Synthetic aperture radar","Radar imaging","Libraries","Object recognition","Vehicles"
Conference_Titel :
Electromagnetics in Advanced Applications (ICEAA), 2015 International Conference on
DOI :
10.1109/ICEAA.2015.7297179
