Title :
Integrating parametric and non-parametric models for scene labeling
Author :
Bing Shuai;Gang Wang;Zhen Zuo;Bing Wang;Lifan Zhao
Author_Institution :
School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore, 639798
fDate :
6/1/2015 12:00:00 AM
Abstract :
We adopt Convolutional Neural Networks (CNN) as our parametric model to learn discriminative features and classifiers for local patch classification. As visually similar pixels are indistinguishable from local context, we alleviate such ambiguity by introducing a global scene constraint. We estimate the global potential in a non-parametric framework. Furthermore, a large margin based CNN metric learning method is proposed for better global potential estimation. The final pixel class prediction is performed by integrating local and global beliefs. Even without any post-processing, we achieve state-of-the-art performance on SiftFlow and competitive results on Stanford Background benchmark.
Keywords :
"Labeling","Context","Measurement","Semantics","Yttrium","Estimation","Roads"
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2015 IEEE Conference on
Electronic_ISBN :
1063-6919
DOI :
10.1109/CVPR.2015.7299053