Title :
Electrically testable CMOS image pixel circuit
Author :
Masaki Hashizume;Shingo Saijo;Hiroyuki Yotsuyanng
Author_Institution :
Institute of Technology and Science, Tokushima University, Tokushima, 770-8506 Japan
Abstract :
A CMOS image pixel circuit is proposed which is able to be tested by an electrical test method in this paper. The image pixel circuit is tested as an analog circuit without irradiating light to it. A CMOS image sensor is designed to evaluate testability of the pixel circuit. It is shown by SPICE simulation whether 89% of open defects inserted in the image pixel circuit are detected by the electrical test method.
Keywords :
"CMOS image sensors","CMOS integrated circuits","Generators","Voltage measurement","Layout","Semiconductor device modeling"
Conference_Titel :
Circuit Theory and Design (ECCTD), 2015 European Conference on
DOI :
10.1109/ECCTD.2015.7300000
