• DocumentCode
    3672949
  • Title

    Reliability schemes for nano-communications

  • Author

    Valeriu Beiu;Leonard Dăuş

  • Author_Institution
    College of IT, UAE University, Al Ain, UAE
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper we consider consecutive systems as a possible match for certain nano-technologies, as communicating at the nanoscale will need very reliable schemes (for achieving low transmission bit error rates). In fact, nano-technologies like, e.g., molecular, nano-fluidic, nano-magnetic (and even FinFETs), might be used for mapping consecutive systems. We shall start by mentioning previous results for 1D consecutive systems, before focusing on 2D ones. After introducing 2D consecutive systems, the paper will present bounds for estimating their reliability. Simulation results for particular 2D consecutive cases will show that some of the bounds are in fact exact. Finally, comparisons of classical and consecutive schemes will show their advantages, and will be followed by conclusions and future directions of research.
  • Keywords
    "Upper bound","Redundancy","Reliability theory","Integrated circuit reliability","Reliability engineering","Accuracy"
  • Publisher
    ieee
  • Conference_Titel
    Circuit Theory and Design (ECCTD), 2015 European Conference on
  • Type

    conf

  • DOI
    10.1109/ECCTD.2015.7300038
  • Filename
    7300038