DocumentCode :
3672957
Title :
From fan-out wafer to fan-out panel level packaging
Author :
T. Braun;K.-F. Becker;S. Raatz;V. Bader;J. Bauer;R. Aschenbrenner;S. Voges;T. Thomas;R. Kahle;K.-D. Lang
Author_Institution :
Fraunhofer Institute for Reliability and Microintegration, Berlin, Germany
fYear :
2015
Firstpage :
1
Lastpage :
4
Abstract :
Fan-out Wafer Level Packaging (FOWLP) is one of the latest packaging trends in microelectronics for heterogeneous system integration. This paper describes the technological path from wafer level embedding to 24"×18" fan-out panel level packaging technology in combination with low cost PCB based RDL processes and discusses challenges and opportunities in detail. The technology described offers a cost effective packaging solution for various application as autonomous sensor nodes, packages for handheld consumer application or bio-medical application as sensor integration into microfluidics.
Keywords :
"Packaging","Application specific integrated circuits","Acceleration","Three-dimensional displays","Assembly","Compression molding","Microfluidics"
Publisher :
ieee
Conference_Titel :
Circuit Theory and Design (ECCTD), 2015 European Conference on
Type :
conf
DOI :
10.1109/ECCTD.2015.7300046
Filename :
7300046
Link To Document :
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