Title :
Experimental determining ideality coefficient for different kind of semiconductor diodes using NI ELVIS II+
Author :
Gheorghe Andrei;Ion Sima;Cristian Andrei
fDate :
6/1/2015 12:00:00 AM
Abstract :
This paper propose the experimental determination of ideality coefficient or emission coefficient for an actual diode in laboratory, using NI ELVIS II+, which enables current-voltage characteristic lifting semi-logarithmic coordinates. In addition it is determined the reverse bias saturation current of diode.
Keywords :
"Schottky diodes","Semiconductor device measurement","Current measurement","Nickel","Silicon","Current-voltage characteristics"
Conference_Titel :
Electronics, Computers and Artificial Intelligence (ECAI), 2015 7th International Conference on
Print_ISBN :
978-1-4673-6646-5
DOI :
10.1109/ECAI.2015.7301251
