DocumentCode :
3674041
Title :
Verification of generalized inference diagnosability for decentralized diagnosis in discrete event systems
Author :
Shigemasa Takai;Ratnesh Kumar
Author_Institution :
Division of Electrical, Electronic and Information Engineering, Osaka University, Suita, 565-0871, Japan
fYear :
2015
Firstpage :
1
Lastpage :
8
Abstract :
Previously we have introduced an inference-based framework for decentralized decision-making, where inferencing over the ambiguities of the self and the others is used to issue decisions. In this setting, we previously introduced the notion of N-inference V-diagnosability to characterize the existence of a disjunctive decentralized diagnosis scheme so that any fault can be detected within bounded delay, using at most N-levels of inferencing, by one of the diagnosers. While the disjunctive scheme relies on one of the diagnosers making the failure decision, the dual conjunctive scheme relies on none of the diagnosers making the nonfailure decision. It is known that the two schemes are incomparable, and in another paper we extend our earlier work to provide a more general framework, introducing the notion of N-inference diagnosability, capturing both disjunctive and conjunctive schemes. The contribution of this paper is developing a method for verifying N-inference diagnosability.
Keywords :
"Decision making","Indexes","Automata","Generators","Delays","Discrete-event systems","Electronic mail"
Publisher :
ieee
Conference_Titel :
Emerging Technologies & Factory Automation (ETFA), 2015 IEEE 20th Conference on
Type :
conf
DOI :
10.1109/ETFA.2015.7301419
Filename :
7301419
Link To Document :
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