Title :
I-V curves for cylinders embedded in P3HT
Author :
C. Huang;M.A. Stroscio
Author_Institution :
Department of Electrical and Computer Engineering, University of Illinois at Chicago Chicago, Illinois, USA
Abstract :
Comparison between simulation and measurement of Current-Voltage curves for CdS cylinders embedded in P3HT. Using interface recombination makes the curve of simulation to match the curve of measurement.
Keywords :
"Mathematical model","Current measurement","Heterojunctions","Polymers","Computational modeling","Radiative recombination","Semiconductor device measurement"
Conference_Titel :
Computational Electronics (IWCE), 2015 International Workshop on
DOI :
10.1109/IWCE.2015.7301964
