• DocumentCode
    3675218
  • Title

    Full electromagnetic simulation of a scanning microwave microscope for quantitative estimation of material properties

  • Author

    Tamara Monti;Pietro Iezzi;Marco Farina;Sam W. Kingman

  • Author_Institution
    Dept. of Environmental and Chemical Eng., University Of Nottingham, University Park, NG7 1RD, (UK)
  • fYear
    2015
  • fDate
    5/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    An essential step for studying and efficiently exploiting microwave fields in materials processing is the dielectric characterization of the samples to be treated. The dielectric behavior of a material determines the degree of interaction with the electromagnetic field, and then the intrinsic efficiency of the processing. From this information it is possible to design and optimize a proper microwave applicator.
  • Publisher
    ieee
  • Conference_Titel
    Radio Science Conference (URSI AT-RASC), 2015 1st URSI Atlantic
  • Type

    conf

  • DOI
    10.1109/URSI-AT-RASC.2015.7303066
  • Filename
    7303066
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3675218