Material characterization uncertainty analysis for Rectangular to Square Waveguide

The advent of physically realizable bi-isotropic, anisotropic and bi-anisotropic media poses new challenges to material characterization techniques and requires better measurement uncertainty understanding to accurately quantify complex media performance. A Waveguide Rectangular to Waveguide Square (WRWS) biaxial anisotropic material measurement capability has been developed to evaluate 3-D printed anisotropic samples. The X-band WRWS system has tapered waveguide transitions that mount to a cubic sample holder for 2-port network analyzer measurements. The WRWS transitions adapt WR-90 rectangular waveguides to the square aperture of a cubic sample holder without exciting higher order modes. A closed form, analytic biaxial anisotropic material parameter extraction methodology has been developed to evaluate a 3-D printed cubic biaxial anisotropic sample about its six orientations.