Title :
Waveforms and signal processing for high-accuracy microwave metrology
Author :
Kojo S. Zilevu;Jason E. Hodkin;Matthew D. Sharp;Thomas M. Comberiate;Jeffrey A. Nanzer
Author_Institution :
Johns Hopkins University Applied Physics Laboratory, Laurel, MD 20723, USA
fDate :
7/1/2015 12:00:00 AM
Abstract :
In this paper, the waveforms and signal processing for a high-accuracy X-Band microwave ranging system that enables a non-cooperative, open-loop coherent distributed radio frequency transmission system are presented. This sub-centimeter-accurate ranging system leverages a Two-Tone Continuous Wave (TTCW) signal as opposed to the conventional Linear-Frequency Modulated (LFM) waveform for ranging. Measurements for the TTCW are shown to achieve better accuracies than a LFM waveform given the same bandwidth and signal to noise ratio.
Keywords :
"Bandwidth","Accuracy","Signal to noise ratio","Distance measurement","Radio frequency","Gain"
Conference_Titel :
Antennas and Propagation & USNC/URSI National Radio Science Meeting, 2015 IEEE International Symposium on
DOI :
10.1109/APS.2015.7304876
