• DocumentCode
    3677262
  • Title

    Carrier lifetime assessment in integrated Ge waveguide devices

  • Author

    S. A. Srinivasan;M. Pantouvaki;P. Verheyen;G. Lepaee;P. Absil;J. Van Campenhout;D. Van ThouAout

  • Author_Institution
    Imec, Kapeldreef 75, Heverlee B-3001, Belgium
  • fYear
    2015
  • Firstpage
    167
  • Lastpage
    168
  • Abstract
    Carrier lifetimes in Ge waveguides on Si are deduced from time-resolved pump-probe spectroscopy. For a 1 μm wide Ge waveguide, a lifetime of 1.6 ns is estimated for a carrier density of around 2×1019cm-3.
  • Publisher
    ieee
  • Conference_Titel
    Group IV Photonics (GFP), 2015 IEEE 12th International Conference on
  • Type

    conf

  • DOI
    10.1109/Group4.2015.7305916
  • Filename
    7305916
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3677262