DocumentCode :
3678391
Title :
VecMeter: Measuring Vectorization on the Xeon Phi
Author :
Joshua Peraza;Ananta Tiwari;William A. Ward;Roy Campbell;Laura Carrington
Author_Institution :
Performance Modeling &
fYear :
2015
Firstpage :
478
Lastpage :
481
Abstract :
Wide vector units in Intel´s Xeon Phi accelerator cards can significantly boost application performance when used effectively. However, there is a lack of performance tools that provide programmers accurate information about the level of vectorization in their codes. This paper presents VecMeter, an easy-to-use tool to measure vectorization on the Xeon Phi. VecMeter utilizes binary instrumentation and therefore does not require source code modifications. This paper describes the design of VecMeter, demonstrates its accuracy, defines a metric for quantifying vectorization, and provides an example where the tool can guide code optimization to improve performance by up to 33%.
Keywords :
"Radiation detectors","Hardware","Kernel","Registers","Measurement","Instruments","Context"
Publisher :
ieee
Conference_Titel :
Cluster Computing (CLUSTER), 2015 IEEE International Conference on
Type :
conf
DOI :
10.1109/CLUSTER.2015.73
Filename :
7307620
Link To Document :
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