DocumentCode :
3678642
Title :
Fault-resilient decoders and memories made of unreliable components
Author :
Bane Vasić;Predrag Ivanis;Srdan Brkic;Vida Ravanmehr
Author_Institution :
Department of ECE, University of Arizona, USA
fYear :
2015
Firstpage :
136
Lastpage :
142
Abstract :
In this paper we present our recent results on iterative Gallager B decoder made of unreliable logic gates. We show evidence that probabilistic behavior of a decoder due to unreliable components can be exploited to our advantage and lead to an improved performance and reduced hardware redundancy. We provide examples of such decoder behavior and give an explanation of this phenomenon using iterative decoding dynamics. Iterative decoding can be viewed as a recursive procedure for Bethe free energy function minimization, and the randomness in a message update may help the decoder to escape from local minima. The decoder operates in a stochastic fashion, but the random perturbations do not require any additional hardware as they are built-in the faulty hardware itself.
Keywords :
"Logic gates","Yttrium","Charge carrier processes"
Publisher :
ieee
Conference_Titel :
Information Theory and Applications Workshop (ITA), 2015
Type :
conf
DOI :
10.1109/ITA.2015.7308978
Filename :
7308978
Link To Document :
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