• DocumentCode
    3679106
  • Title

    Reducing the Storage Requirements of a Set of Functional Test Sequences by Using a Background Sequence

  • Author

    Irith Pomeranz

  • Author_Institution
    Sch. of Electr. &
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    155
  • Lastpage
    160
  • Abstract
    An existing storage scheme for a functional test sequence T uses a vector B, called a background vector, to store only the differences between the test vectors of T and B. After selecting B, modifying T based on B reduces the storage requirements of T. This paper describes a storage scheme for a set of test sequences T that uses a test sequence B, called a background sequence, to store only the differences between the sequences in T and B. The use of a background sequence allows more flexibility in matching B to T. By selecting B from the sequences in T, storage of B does not increase the storage requirements of T, and B itself contributes to the fault coverage. The paper describes a procedure for selecting a background sequence B from a set of sequences T, and for modifying T (including B) in order to reduce the storage requirements of T.
  • Keywords
    "Circuit faults","Compaction","Clocks","Benchmark testing","System-on-chip","Computers","Encoding"
  • Publisher
    ieee
  • Conference_Titel
    VLSI (ISVLSI), 2015 IEEE Computer Society Annual Symposium on
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2015.15
  • Filename
    7309555