DocumentCode :
3679813
Title :
Switching frequency modulation for GaN-based power converters
Author :
B. Weiss;R. Reiner;R. Quay;P. Waltereit;F. Benkhelifa;M. Mikulla;M. Schlechtweg;O. Ambacher
Author_Institution :
Fraunhofer Institute of Applied Solid State Physics Freiburg, Germany
fYear :
2015
Firstpage :
4361
Lastpage :
4366
Abstract :
The effects on the EMI spectrum for various switching frequency modulation (SFM) scenarios in a high frequency boost converter are investigated in this paper. A GaN-device and a Si-device are compared with respect to their EMI behavior, which results from different gate charges and therefore different voltage gradients dv/dt on the power lines. First, the dynamic characteristics of the GaN-HEMT are demonstrated in detail. Then the behavior in the time domain and the frequency domain for switching operations at 300 kHz with various frequency modulation settings and an output power of 250 W are presented.
Keywords :
"Frequency modulation","Switches","Gallium nitride","Frequency measurement","Silicon","Electromagnetic interference"
Publisher :
ieee
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2015 IEEE
ISSN :
2329-3721
Electronic_ISBN :
2329-3748
Type :
conf
DOI :
10.1109/ECCE.2015.7310276
Filename :
7310276
Link To Document :
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