• DocumentCode
    3680059
  • Title

    Challenges in switching waveforms measurement for a high-speed switching module

  • Author

    C. F. Tong;A. Nawawi;Yitao Liu;Shan Yin;K. J. Tseng;Yong Liu;K. Y. See;A. Sakanova;Rejeki Simanjorang;C. J. Gajanayake;A. Gupta

  • Author_Institution
    Rolls-Royce@NTU Corporate Lab, Nanyang Technological University Singapore
  • fYear
    2015
  • Firstpage
    6175
  • Lastpage
    6179
  • Abstract
    As SiC MOSFET is moving towards high current rating through parallel devices in a module, the ability to switch it fast with minimum switching loss becomes a new challenge. Amid this new challenge, power converter designers need to deal with more demanding measurement method to obtain correct switching waveforms. Switching waveforms are an important asset for converter designers because they can reveal vital parasitic information, indicate any potential overshoot or undershoot and estimate the switching loss. This paper shares the experimental work results, its measurement techniques (current and voltage) and test setup use to obtain minimum voltage overshoot of a 5 parallel SiC devices module. The cable length (of voltage probe) is shown to directly affect the switching loss estimation especially when a fast 5Ω gate driver resistance is used.
  • Keywords
    "Probes","Silicon carbide","Switches","Switching loss","MOSFET","Voltage measurement","Bandwidth"
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2015 IEEE
  • ISSN
    2329-3721
  • Electronic_ISBN
    2329-3748
  • Type

    conf

  • DOI
    10.1109/ECCE.2015.7310525
  • Filename
    7310525