DocumentCode
3680839
Title
Soft recovery diodes with snappy behavior
Author
Peter Losee;Max-Josef Kell;Fabio Carastro;Jorge Mari;Matthias Menzel;Tobias Schuetz;Thomas Zoels
Author_Institution
GE Global Research, Niskayuna, NY 12309, USA
fYear
2015
Firstpage
1
Lastpage
10
Abstract
This paper illustrates several issues that a user of high voltage PiN diodes may encounter in actual application conditions. It shows that high-voltage power diodes require specifiable on-time prior to entering their reverse recovery phase and offers 1D device simulations and measurements taken on several actual high power diodes to illustrate and explain all the concepts introduced.
Keywords
"Plasmas","Oscillators","PIN photodiodes","Silicon","Conductivity","Turning","Inductance"
Publisher
ieee
Conference_Titel
Power Electronics and Applications (EPE´15 ECCE-Europe), 2015 17th European Conference on
Type
conf
DOI
10.1109/EPE.2015.7311692
Filename
7311692
Link To Document