• DocumentCode
    3682791
  • Title

    An optimal operating point by using error monitoring circuits with an error-resilient technique

  • Author

    Jaemin Lee;Seungwon Kim;Youngmin Kim;Seokhyeong Kang

  • Author_Institution
    School of Electrical and Computer Engineering, Ulsan National Institute of Science and Technology, Korea 689-798
  • fYear
    2015
  • Firstpage
    69
  • Lastpage
    73
  • Abstract
    For applications related to human, such as Internet of Things (loT) and wearable devices, near threshold voltage (NTV) technology has been proposed for the trade-off between performance and energy consumption. However, errorresilient techniques are required in the circuits to improve reliability of the NTV operation. In this paper, we propose a low-overhead error-resilient system and a design flow for NTV operations. We use a new monitoring circuit, which can detect timing errors and find an optimal operation point of the system. Also, we propose two different methodologies, which are slack-based methodology and sensitivity-based methodology. From the proposed monitoring system and the sensitivitybased sorting algorithm, benchmark results show that the optimal designs provide up to 46% monitoring area reduction maintaining similar error detection ability of the conventional error-resilient design.
  • Keywords
    "Monitoring","Sensitivity","Logic gates","Integrated circuit reliability","Registers","Area measurement"
  • Publisher
    ieee
  • Conference_Titel
    Very Large Scale Integration (VLSI-SoC), 2015 IFIP/IEEE International Conference on
  • Electronic_ISBN
    2324-8440
  • Type

    conf

  • DOI
    10.1109/VLSI-SoC.2015.7314394
  • Filename
    7314394