DocumentCode
3682791
Title
An optimal operating point by using error monitoring circuits with an error-resilient technique
Author
Jaemin Lee;Seungwon Kim;Youngmin Kim;Seokhyeong Kang
Author_Institution
School of Electrical and Computer Engineering, Ulsan National Institute of Science and Technology, Korea 689-798
fYear
2015
Firstpage
69
Lastpage
73
Abstract
For applications related to human, such as Internet of Things (loT) and wearable devices, near threshold voltage (NTV) technology has been proposed for the trade-off between performance and energy consumption. However, errorresilient techniques are required in the circuits to improve reliability of the NTV operation. In this paper, we propose a low-overhead error-resilient system and a design flow for NTV operations. We use a new monitoring circuit, which can detect timing errors and find an optimal operation point of the system. Also, we propose two different methodologies, which are slack-based methodology and sensitivity-based methodology. From the proposed monitoring system and the sensitivitybased sorting algorithm, benchmark results show that the optimal designs provide up to 46% monitoring area reduction maintaining similar error detection ability of the conventional error-resilient design.
Keywords
"Monitoring","Sensitivity","Logic gates","Integrated circuit reliability","Registers","Area measurement"
Publisher
ieee
Conference_Titel
Very Large Scale Integration (VLSI-SoC), 2015 IFIP/IEEE International Conference on
Electronic_ISBN
2324-8440
Type
conf
DOI
10.1109/VLSI-SoC.2015.7314394
Filename
7314394
Link To Document