DocumentCode :
3682838
Title :
A cluster-based reliability- and thermal-aware 3D floorplanning using redundant STSVs
Author :
Ying-Jung Chen;Shanq-Jang Ruan
Author_Institution :
National Taiwan University of Science and Technology, 43, Sec.4, Keelung Rd., Taipei, 106, Taiwan, R.O.C
fYear :
2015
Firstpage :
349
Lastpage :
354
Abstract :
In 3D-IC architecture, vertically stacked multiple layer impedes heat dissipation and exacerbates thermal problem especially for reliability degradation. In this paper, we propose a cluster-based reliability- and thermal- aware 3D floorplanning to place modules. We derive a cost function considering both reliability and thermal factors with the balance among the chip of area, wire length, power density and density of STSV in the floorplan. Then we insert rectangle-STSVs and double-STSVs for improving reliability by modified Ford-Fulkerson method. Furthermore, we enhance redundant STSVs insertion rate by RSI algorithm. The experimental results show that more than 80% of single-STSVs can be replaced by rectangle-STSVs or double-STSVs, improving reliability accordingly. After STSV insertion, we construct a precise thermal conduction model to compute temperature distribution and insert TTSVs.Our framework is able to reduce the peak temperature effectively and maintain around 80 °C with minimal TTSVs based on a precise temperature computation model.
Keywords :
"Three-dimensional displays","Density measurement","Power system measurements","Wires","Heating","Integrated circuit reliability"
Publisher :
ieee
Conference_Titel :
Very Large Scale Integration (VLSI-SoC), 2015 IFIP/IEEE International Conference on
Electronic_ISBN :
2324-8440
Type :
conf
DOI :
10.1109/VLSI-SoC.2015.7314442
Filename :
7314442
Link To Document :
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