DocumentCode :
3682876
Title :
A Study of GaN HEMTs Current Collapse Impacts on Doherty Multistage PA Linearity
Author :
Yoji Murao;Makoto Hayakawa;Kazuya Ohgami;Tomoya Kaneko
Author_Institution :
NEC Corp., Kanagawa, Japan
fYear :
2015
Firstpage :
1
Lastpage :
4
Abstract :
The effect of current collapse with regard to operating class of GaN HEMTs is studied. It is shown that AM-AM deviation due to current collapse is maximized in class AB, while it is reduced under both class A and class C region. A Doherty multi-stage amplifier is designed considering these effects to achieve both high efficiency and linearity. A 2W-class 1.8GHz multistage GaN Doherty PA shows PA chain efficiency of 38% with the power gain of 50.5dB. ACLR of -51dBc is obtained for 20MHz LTE carrier using a commercially available RF predistorter IC.
Keywords :
"Logic gates","Gallium nitride","HEMTs","MODFETs","Linearity","Power amplifiers"
Publisher :
ieee
Conference_Titel :
Compound Semiconductor Integrated Circuit Symposium (CSICS), 2015 IEEE
Type :
conf
DOI :
10.1109/CSICS.2015.7314483
Filename :
7314483
Link To Document :
بازگشت