• DocumentCode
    3682876
  • Title

    A Study of GaN HEMTs Current Collapse Impacts on Doherty Multistage PA Linearity

  • Author

    Yoji Murao;Makoto Hayakawa;Kazuya Ohgami;Tomoya Kaneko

  • Author_Institution
    NEC Corp., Kanagawa, Japan
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The effect of current collapse with regard to operating class of GaN HEMTs is studied. It is shown that AM-AM deviation due to current collapse is maximized in class AB, while it is reduced under both class A and class C region. A Doherty multi-stage amplifier is designed considering these effects to achieve both high efficiency and linearity. A 2W-class 1.8GHz multistage GaN Doherty PA shows PA chain efficiency of 38% with the power gain of 50.5dB. ACLR of -51dBc is obtained for 20MHz LTE carrier using a commercially available RF predistorter IC.
  • Keywords
    "Logic gates","Gallium nitride","HEMTs","MODFETs","Linearity","Power amplifiers"
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductor Integrated Circuit Symposium (CSICS), 2015 IEEE
  • Type

    conf

  • DOI
    10.1109/CSICS.2015.7314483
  • Filename
    7314483