DocumentCode :
3682882
Title :
An Overview of GaN-Based Monolithic Power Integrated Circuit Technology on Polarization-Junction Platform
Author :
Akira Nakajima;Sin-ichi Nishizawa;Shunsuke Kubota;Rei Kayanuma;Kazuo Tsutsui;Hiromichi Ohashi;Kuniyuki Kakushima;Hitoshi Wakabayashi;Hiroshi Iwai
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. &
fYear :
2015
Firstpage :
1
Lastpage :
4
Abstract :
This paper gives an overview of GaN-based polarization-junction (PJ) technologies. PJ platform wafers have both high-density 2D hole gas (2DHG) and 2D electron gas (2DEG) respectively induced by negative and positive polarization charges in undoped GaN/AlGaN/GaN double heterostructures. On the platform, monolithic operations of GaN-based n-channel transistors and p-channel transistors have been demonstrated. Because of temperature independent properties of the 2DHG and 2DEG, the GaN devices can operate in wide temperature range. In addition, high voltage transistors and diode are also available on the platform by using polarization-superjunction concept.
Keywords :
"HEMTs","MODFETs","Gallium nitride","Two dimensional hole gas","Temperature","Logic gates","Aluminum gallium nitride"
Publisher :
ieee
Conference_Titel :
Compound Semiconductor Integrated Circuit Symposium (CSICS), 2015 IEEE
Type :
conf
DOI :
10.1109/CSICS.2015.7314489
Filename :
7314489
Link To Document :
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