• DocumentCode
    3683104
  • Title

    A comprehensive ESD verification flow at transistor level for large SoC designs

  • Author

    Jérôme Lescot;Patrice Dehan;Wahbi Boujarra;Dina Medhat;Sophie Billy

  • Author_Institution
    STMicroelectronics, 850 rue Jean Monnet, Crolles, 38920, France
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    A fast yet robust multi-domain ESD verification flow at transistor level has been developed for large SoC designs. All steps of the verification process from initial power domains configuration to the final debugging process are covered in this comprehensive solution that supports scalable ESD protection structures.
  • Keywords
    "Electrostatic discharges","SPICE","Layout","Topology","Transistors","Engines","System-on-chip"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
  • Type

    conf

  • DOI
    10.1109/EOSESD.2015.7314740
  • Filename
    7314740