• DocumentCode
    3683107
  • Title

    Source of miscorrelation of product level HBM to TLP test results

  • Author

    Manjunatha Prabhu; Jian-Hsing Lee;Mahadeva Iyer Natarajan;Vasantha Kumar;Ruchil Jain; Tsung-Che Tsai; Li Zhiqing;Dominic Thurmer

  • Author_Institution
    GLOBALFOUNDRIES Inc, 400 Stone Break Road Ext., MALTA NY 12020 USA
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Correlation between TLP and HBM test results at product level and/or complex ESD circuit is not feasible. In product level HBM testing there can be stress condition which is worse at low current compared to high ESD current. Such results cannot be replicated in TLP.
  • Keywords
    "Stress","Electrostatic discharges","Discharges (electric)","MOSFET","Current distribution","Current density"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
  • Type

    conf

  • DOI
    10.1109/EOSESD.2015.7314743
  • Filename
    7314743
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3683107