DocumentCode
3683115
Title
Secondary discharge - A potential risk during system level ESD testing
Author
Heinrich Wolf;Horst Gieser
Author_Institution
Fraunhofer EMFT, Hansastr. 27 d, 80686 Munich, Germany
fYear
2015
Firstpage
1
Lastpage
7
Abstract
By means of a floating handheld electronic product this work describes the influence of secondary discharge events during system level ESD testing on the failure threshold of the involved electronic circuit. In order to increase the robustness it was necessary to determine the discharge current target levels by a dedicated test set-up which was also used to verify the success of system modifications. This was a prerequisite for identifying the sensitive pins and for increasing the ESD robustness of the system.
Keywords
"Stress","Discharges (electric)","Electrostatic discharges","Current measurement","Metals","Capacitance","Integrated circuits"
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
Type
conf
DOI
10.1109/EOSESD.2015.7314751
Filename
7314751
Link To Document