• DocumentCode
    3683115
  • Title

    Secondary discharge - A potential risk during system level ESD testing

  • Author

    Heinrich Wolf;Horst Gieser

  • Author_Institution
    Fraunhofer EMFT, Hansastr. 27 d, 80686 Munich, Germany
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    By means of a floating handheld electronic product this work describes the influence of secondary discharge events during system level ESD testing on the failure threshold of the involved electronic circuit. In order to increase the robustness it was necessary to determine the discharge current target levels by a dedicated test set-up which was also used to verify the success of system modifications. This was a prerequisite for identifying the sensitive pins and for increasing the ESD robustness of the system.
  • Keywords
    "Stress","Discharges (electric)","Electrostatic discharges","Current measurement","Metals","Capacitance","Integrated circuits"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
  • Type

    conf

  • DOI
    10.1109/EOSESD.2015.7314751
  • Filename
    7314751