DocumentCode
3683130
Title
The effect of USB ground cable and product dynamic capacitance on IEC61000-4-2 qualification
Author
Pasi Tamminen;Leena Ukkonen;Lauri Sydänheimo
Author_Institution
Electronics and Computer Technology department, Tampere University of Technology, Finland
fYear
2015
Firstpage
1
Lastpage
10
Abstract
IEC61000-4-2 discharge stress levels are studied with varying product capacitance and ground connections. Stress levels are evaluated based on the measured and simulated peak current, peak power, pulse rise time, and energy transfer along to the USB cable. These stress parameters can be significantly affected by adjusting the test setup.
Keywords
"Universal Serial Bus","Capacitance","Electrostatic discharges","Discharges (electric)","Current measurement","Ferrites","Solid modeling"
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
Type
conf
DOI
10.1109/EOSESD.2015.7314766
Filename
7314766
Link To Document