• DocumentCode
    3683130
  • Title

    The effect of USB ground cable and product dynamic capacitance on IEC61000-4-2 qualification

  • Author

    Pasi Tamminen;Leena Ukkonen;Lauri Sydänheimo

  • Author_Institution
    Electronics and Computer Technology department, Tampere University of Technology, Finland
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    IEC61000-4-2 discharge stress levels are studied with varying product capacitance and ground connections. Stress levels are evaluated based on the measured and simulated peak current, peak power, pulse rise time, and energy transfer along to the USB cable. These stress parameters can be significantly affected by adjusting the test setup.
  • Keywords
    "Universal Serial Bus","Capacitance","Electrostatic discharges","Discharges (electric)","Current measurement","Ferrites","Solid modeling"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
  • Type

    conf

  • DOI
    10.1109/EOSESD.2015.7314766
  • Filename
    7314766