Title :
The effect of USB ground cable and product dynamic capacitance on IEC61000-4-2 qualification
Author :
Pasi Tamminen;Leena Ukkonen;Lauri Sydänheimo
Author_Institution :
Electronics and Computer Technology department, Tampere University of Technology, Finland
Abstract :
IEC61000-4-2 discharge stress levels are studied with varying product capacitance and ground connections. Stress levels are evaluated based on the measured and simulated peak current, peak power, pulse rise time, and energy transfer along to the USB cable. These stress parameters can be significantly affected by adjusting the test setup.
Keywords :
"Universal Serial Bus","Capacitance","Electrostatic discharges","Discharges (electric)","Current measurement","Ferrites","Solid modeling"
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
DOI :
10.1109/EOSESD.2015.7314766
