Title :
Low impedance contact CDM
Author :
Nathan Jack;Timothy J. Maloney
Author_Institution :
Intel Corporation, 2501 NW 229th Ave., Hillsboro, OR 97124 USA
Abstract :
Relay-based contact CDM (CCDM) is shown to closely replicate the waveforms and failure currents of legacy field-induced CDM when the effective system impedances are approximately matched. The repeatability of the waveforms will be crucially important as CDM test levels decrease below 250 V. Recommendations for inclusion in future standards are presented.
Keywords :
"Discharges (electric)","Impedance","Stress","Standards","Coaxial cables","Calibration","Oscilloscopes"
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
DOI :
10.1109/EOSESD.2015.7314779
