Title :
EOS characterization methodology applied to disable feature of ESD power clamps
Author :
Jorge Loayza;Nicolas Guitard;Blaise Jacquier;Alexandre Dray;Divya Agarwal;Vicky Batra;Bruno Allard; Luong Viêt Phung
Author_Institution :
STMicroelectronics, 850 rue Jean Monnet, F-38926 Crolles Cedex FRANCE
Abstract :
This work presents an EOS characterization methodology for ESD clamps. BigFET-based and SCR-based power clamps with and without disable feature are characterized. Thanks to the proposed characterization methodology, robustness comparison is provided for the different ESD clamps, giving insights on improving IC robustness against undesired triggering during EOS events.
Keywords :
"Clamps","Electrostatic discharges","Thyristors","Earth Observing System","Integrated circuits","Trigger circuits","Robustness"
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
DOI :
10.1109/EOSESD.2015.7314782
