Title :
An off-chip ESD protection for high-speed interfaces
Author :
Guido Notermans;Hans-Martin Ritter;Joachim Utzig;Steffen Holland; Zhihao Pan;Jochen Wynants;Paul Huiskamp;Wim Peters;Burkhard Laue
Author_Institution :
NXP Semiconductors Germany GmbH, Stresemannallee 101, 22529 Hamburg, Germany
Abstract :
High-speed interfaces, e.g. for USB3.1 or HDMI2.0, require high system level ESD protection, typically 15 kV, without affecting signal integrity. This paper describes the development of a novel bipolar process and the design of a fast-switching, low-voltage clamping protection combining high protection capability with excellent signal integrity.
Keywords :
"Capacitance","Thyristors","Electrostatic discharges","Metals","Junctions","Substrates","Clamps"
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
DOI :
10.1109/EOSESD.2015.7314786
