• DocumentCode
    3683150
  • Title

    Versatile models and expanded application of the IEC 61000-4-2 test

  • Author

    Timothy J. Maloney

  • Author_Institution
    Intel Corporation, SC9-09, 2200 Mission College Blvd. Santa Clara, CA 95052 USA
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    An all-purpose circuit model and associated shorting current waveform expression for the IEC 61000-4-2 pulse is presented. Criteria include agreement with existing IEC guidance plus zero field derivative at t=0, for accurate radiation modeling. Also, a capacitive coupling tool for IEC pulsers is used to simulate platform I/O port hazards.
  • Keywords
    "Integrated circuit modeling","Hidden Markov models","IEC","IEC Standards","Capacitance","Couplings","Analytical models"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
  • Type

    conf

  • DOI
    10.1109/EOSESD.2015.7314788
  • Filename
    7314788
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3683150