DocumentCode :
3683156
Title :
A low-impedance TLP measurement system for power semiconductor characterization up to 700V and 400A in the microsecond range
Author :
Gabriel Cretu;Marius Cenusa;Martin Pfost;Kevni Büyüktas;Uwe Wahl
Author_Institution :
Robert Bosch Center for Power Electronics, Reutlingen University, Alteburgstr. 150, 72762, Germany
fYear :
2015
Firstpage :
1
Lastpage :
7
Abstract :
A TLP system with a very low characteristic impedance of 1.5Ω and a selectable pulse length from 0.5 to 6 μs is presented. It covers the entire operation region of many power semiconductors up to 700V and 400 A. Its applicability is demonstrated by determining the output characteristics for two CoolMOS devices up to destruction.
Keywords :
"Chlorine","Irrigation","Switches","Integrated circuits"
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
Type :
conf
DOI :
10.1109/EOSESD.2015.7314794
Filename :
7314794
Link To Document :
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