Title :
Soft fails due to LU stress of virtual power domains
Author :
Krzysztof Domanski;Harald Gossner
Author_Institution :
Intel Mobile Communications, D-85579 Neubiberg, Germany
Abstract :
A shut-down of IC was caused by current injection into a USB 2.0 pin. Root cause was a substrate current forced into a power rail supplied by a weak LDO. Connecting the guard rings to a robust VDD supply resolved the problem. As the failure could not be revealed by JESD78 testing, a modified latchup test setup is proposed.
Keywords :
"Universal Serial Bus","Substrates","Couplings","Current measurement","Rails","Electrostatic discharges","Layout"
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
DOI :
10.1109/EOSESD.2015.7314795
