Title :
A passive coupling circuit for injecting TLP-like stress pulses into only one end of a driver/receiver system
Author :
Benjamin Orr;David Johnsson;Krzysztof Domanski;Harald Gossner;David Pommerenke
Author_Institution :
EMC Laboratory, Missouri University of Science and Technology, 4000 Enterprise Dr., Rolla, 65401 USA
Abstract :
In this paper, a simple passive circuit is presented which allows TLP stress and characterization pulses to be injected into only one side of a driver/receiver system. The circuit is simulated and tested, demonstrating the possibility for directional current injection on the order of 60:1. The circuit also provides a method for measuring both injected currents when paired with a typical TLP system.
Keywords :
"Current measurement","Integrated circuit modeling","Windings","Current transformers","Load modeling","Voltage measurement","Inductance"
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
DOI :
10.1109/EOSESD.2015.7314800
