• DocumentCode
    3683163
  • Title

    Practical HBM testing with statistical pin combinations

  • Author

    Wolfgang Stadler;Josef Niemesheim;Huelya Guerses;Oliver Hilbricht;Andrea Boroni;Giuseppe Ballarin;Evan Grund

  • Author_Institution
    Intel Mobile Communications, Am Campeon 10-12, D-85579 Neubiberg, Germany
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Instead of using a pin group approach as defined in the current HBM standard JS-001, stressing statistically determined pin pairs can drastically reduce the stress count and the stress time. The correlation of different HBM test methods is discussed with different examples, proving the wide applicability of this approach.
  • Keywords
    "Stress","Pins","Testing","Electrostatic discharges","Qualifications","Integrated circuits","Standards"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
  • Type

    conf

  • DOI
    10.1109/EOSESD.2015.7314801
  • Filename
    7314801
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3683163