DocumentCode
3683892
Title
Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis
Author
Suguru Kanoga;Yasue Mitsukura
Author_Institution
Graduate School of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku, Yokohama, Kanagawa, Japan
fYear
2015
Firstpage
121
Lastpage
124
Abstract
To study an eye blink artifact rejection scheme from single-channel electroencephalographic (EEG) signals has been now a major challenge in the field of EEG signal processing. High removal performance is still needed to more strictly investigate pattern of EEG features. This paper proposes a new eye blink artifact rejection scheme from single-channel EEG signals by combining complete ensemble empirical mode decomposition (CEEMD) and independent component analysis (ICA). We compare the separation performance of our proposed scheme with existing schemes (wavelet-ICA, EMD-ICA, and EEMD-ICA) though real-life data by using signal-to-noise ratio. As a result, CEEMD-ICA showed high performance (11.86 dB) than all other schemes (10.78, 10.59, and 11.30 dB) in the ability of eye blink artifact removal.
Keywords
"Electroencephalography","Empirical mode decomposition","Electric potential","Independent component analysis","Electrooculography","Signal to noise ratio"
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2015 37th Annual International Conference of the IEEE
ISSN
1094-687X
Electronic_ISBN
1558-4615
Type
conf
DOI
10.1109/EMBC.2015.7318315
Filename
7318315
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