• DocumentCode
    3683892
  • Title

    Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis

  • Author

    Suguru Kanoga;Yasue Mitsukura

  • Author_Institution
    Graduate School of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku, Yokohama, Kanagawa, Japan
  • fYear
    2015
  • Firstpage
    121
  • Lastpage
    124
  • Abstract
    To study an eye blink artifact rejection scheme from single-channel electroencephalographic (EEG) signals has been now a major challenge in the field of EEG signal processing. High removal performance is still needed to more strictly investigate pattern of EEG features. This paper proposes a new eye blink artifact rejection scheme from single-channel EEG signals by combining complete ensemble empirical mode decomposition (CEEMD) and independent component analysis (ICA). We compare the separation performance of our proposed scheme with existing schemes (wavelet-ICA, EMD-ICA, and EEMD-ICA) though real-life data by using signal-to-noise ratio. As a result, CEEMD-ICA showed high performance (11.86 dB) than all other schemes (10.78, 10.59, and 11.30 dB) in the ability of eye blink artifact removal.
  • Keywords
    "Electroencephalography","Empirical mode decomposition","Electric potential","Independent component analysis","Electrooculography","Signal to noise ratio"
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2015 37th Annual International Conference of the IEEE
  • ISSN
    1094-687X
  • Electronic_ISBN
    1558-4615
  • Type

    conf

  • DOI
    10.1109/EMBC.2015.7318315
  • Filename
    7318315