DocumentCode :
3683892
Title :
Eye blink artifact rejection in single-channel electroencephalographic signals by complete ensemble empirical mode decomposition and independent component analysis
Author :
Suguru Kanoga;Yasue Mitsukura
Author_Institution :
Graduate School of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku, Yokohama, Kanagawa, Japan
fYear :
2015
Firstpage :
121
Lastpage :
124
Abstract :
To study an eye blink artifact rejection scheme from single-channel electroencephalographic (EEG) signals has been now a major challenge in the field of EEG signal processing. High removal performance is still needed to more strictly investigate pattern of EEG features. This paper proposes a new eye blink artifact rejection scheme from single-channel EEG signals by combining complete ensemble empirical mode decomposition (CEEMD) and independent component analysis (ICA). We compare the separation performance of our proposed scheme with existing schemes (wavelet-ICA, EMD-ICA, and EEMD-ICA) though real-life data by using signal-to-noise ratio. As a result, CEEMD-ICA showed high performance (11.86 dB) than all other schemes (10.78, 10.59, and 11.30 dB) in the ability of eye blink artifact removal.
Keywords :
"Electroencephalography","Empirical mode decomposition","Electric potential","Independent component analysis","Electrooculography","Signal to noise ratio"
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2015 37th Annual International Conference of the IEEE
ISSN :
1094-687X
Electronic_ISBN :
1558-4615
Type :
conf
DOI :
10.1109/EMBC.2015.7318315
Filename :
7318315
Link To Document :
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