DocumentCode :
3684813
Title :
A model of injury potential for myelinated nerve fiber
Author :
Zhang Guang-Hao;Huo Xiao-Lin;Wang Ai-Hua;Zhang Cheng;Wu Chang-Zhe
Author_Institution :
Beijing Key Laboratory of Bioelectromagnetism, Institute of Electrical Engineering, Chinese Academy of Sciences, China
fYear :
2015
Firstpage :
3937
Lastpage :
3940
Abstract :
Excellent models have been described in literatures which related membrane potential to extracellular electric or magnetic stimulation and which described the formation and propagation of action potentials along the axon, for both myelinated and nonmyelinated fibers. There is not, however, an adequate model for nerve injury which allows to compute the distribution of injury potential, a direct current potential difference between intact and injured nerve, because its importance has been ignored in the shadow of the well-known action potential. This paper focus on the injury potential and presents a model of the electrical properties of myelinated nerve which describes the time course of events following injury. The time-varying current and potential at all nodes can be computed from the model, and the factors relate to the amplitude of injury potential can be determined. It is shown that the amplitude of injury potential decreased gradually with injury time, and the recession curve was exponential. Results also showed that the initial amplitude of injury potential is positively related to the grade of injury and fiber diameter. This model explained the mechanism of formation of injury potential and can provide instruction for applied electric field to prevent the formation injury potential.
Keywords :
"Injuries","Electric potential","Capacitance","Resistance","Extracellular","Nerve fibers","Computational modeling"
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2015 37th Annual International Conference of the IEEE
ISSN :
1094-687X
Electronic_ISBN :
1558-4615
Type :
conf
DOI :
10.1109/EMBC.2015.7319255
Filename :
7319255
Link To Document :
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