DocumentCode :
3685887
Title :
A defect dependency based approach to improve software quality in integrated software products
Author :
Sai Anirudh Karre;Y. Raghu Reddy
Author_Institution :
Software Engineering Research Center, International Institute of Information Technology, Hyderabad, India
fYear :
2015
fDate :
4/1/2015 12:00:00 AM
Firstpage :
110
Lastpage :
117
Abstract :
Integrated software products are complex in design. They are prone to defects caused by integrated and non-integrated modules of the entire integrated software suite. In such software products, a small proportion of defects are fixed as soon as they are reported. Rest of the defects are targeted for fixes in future product release cycles. Among such targeted defects, most of them seem to be insignificant and innocuous in the current version but have the potential to become acute in future versions. In this paper, we propose an approach to study defect dependency of the reported defect using a dependency metric. Identifying the dependency of a defect in an integrated product suite can help the product stake-owners to prioritize them and help improve software quality.
Keywords :
"Software","Yttrium","Measurement","Testing","Data mining","Training","Influenza"
Publisher :
ieee
Conference_Titel :
Evaluation of Novel Approaches to Software Engineering (ENASE), 2015 International Conference on
Type :
conf
Filename :
7320343
Link To Document :
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