Preface

In October the scientists from many countries assembled in Tallinn University of Technology to participate at the 14th Baltic Electronics Conference (BEC2014). With this act we continue the long living tradition already over the 25-year BEC conference series initiated in 1987. The BEC2014 conference was held in Tallinn and Laulasmaa. The main organizers were the Thomas Johann Seebeck Department of Electronics together with the Department of Computer Engineering of Tallinn University of Technology (TUT). Support was given by the TUT Technomedicum, and Departments of Computer Science, and of Electrical Engineering. The IEEE Circuits and Systems branch gave the technical sponsorship to our conference. The Competence Centre in Electronics, Info- and Communication Technologies ELKO supported our event from the side of industry and the Laulasmaa Spa Resort gave us many benefits to run our conference in the very nice landscape at the Baltic Sea not very far from Tallinn. In response to the call for papers the International Program Committee we received over 70 papers, mostly from Estonia, Latvia, Lithuania, Hungary, Finland, Sweden, Czech Republic, Slovenia, Germany, Russia, and Poland, but even from USA, Canada, Great Britain, France, Spain, Netherlands, Denmark, Ukraine, Egypt and Algeria. Finally the Conference program featured 8 invited papers and 58 papers for oral presentation. The conference continues the tradition to be the forum for the presentation of the latest research and development results in the area of electronics, micro- and nanotechnologies, embedded systems, dependable computing, signal processing, and RF electronics in the Baltic Sea Region and wider. The conference attracted contributions covering design, analysis, simulation, optimization, and process simulation in component and system electronics, microsystems technology, and embedded systems. All of the papers in the conference proceedings have been directly reproduced from the materials submitted by the authors and all accepted papers will be referred by the IEEEXplore Database.