• DocumentCode
    3688207
  • Title

    0.5–1.3 µm III-nitride lasers and light emitting diodes epitaxially grown on (001) silicon

  • Author

    Arnab Hazari;Aniruddha Bhattacharya;Thomas Frost;Pallab Bhattacharya

  • Author_Institution
    Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, 48109-2122, United States
  • fYear
    2015
  • Firstpage
    563
  • Lastpage
    564
  • Abstract
    We have recently demonstrated electrically pumped 530nm (green) and 615nm (red) InGaN/GaN disk-in-nanowire (DNW) monolithic edge-emitting lasers on (001) silicon substrates. The nanowire heterostructures were grown by molecular beam epitaxy (MBE). These are the only lasers directly grown on (001) silicon without any substrate tilt or intermediate buffers. The lasers have demonstrated excellent steady state (Jth ~ 2kA/cm2, T0 ~ 240K, dg/dn ~ 3×10-17cm2) and dynamic (small-signal modulation bandwidth ~ 4GHz) characteristics and a lifetime ~ 7000hrs. In this study we have extended the emission wavelength from the DNW to 1.46μm, the longest emission wavelength of a monolithic epitaxially grown heterostructure on silicon. Nanowire light-emitting diodes with peak emission at λ = 1.3μm are demonstrated for the first time. The epitaxy of the InGaN/GaN DNW and the long wavelength light sources are described.
  • Keywords
    "Light emitting diodes","Wavelength measurement","Silicon","Gallium nitride","Temperature measurement","Scanning electron microscopy","Substrates"
  • Publisher
    ieee
  • Conference_Titel
    Photonics Conference (IPC), 2015
  • ISSN
    1092-8081
  • Type

    conf

  • DOI
    10.1109/IPCon.2015.7323655
  • Filename
    7323655