DocumentCode
3688244
Title
Low-insertion loss submicron Ta2 O5 channel waveguide with inverse taper structure
Author
Chung-Lun Wu;Bo-Tsang Chen;Wei-Chen Tien;Yuan-Yao Lin;Ann-Kuo Chu;Yi-Jen Chiu;Chao-Kuei Lee
Author_Institution
Department of Photonics, National Sun Yat-sen University, Kaohsiung 804, Taiwan R. O. C.
fYear
2015
Firstpage
328
Lastpage
329
Abstract
The crack-free and low surface roughness of Ta2O5 film has been deposited by magnetron sputtering technique. The propagation loss of 1.5 dB/cm with the total coupling loss of 3.2 dB for the Ta2O5 based channel waveguide with inverse taper structure has been successfully demonstrated.
Keywords
"Annealing","Magnetic cores","Propagation losses","Magnetic films","Magnetic resonance imaging","Monitoring","Insertion loss"
Publisher
ieee
Conference_Titel
Photonics Conference (IPC), 2015
ISSN
1092-8081
Type
conf
DOI
10.1109/IPCon.2015.7323692
Filename
7323692
Link To Document