Title :
Fast high power capacitive RF-MEMS switch for X-Band applications
Author :
A. Ziaei;S. Bansropun;P. Martins;M. Le Baillif
Author_Institution :
Group de Recherche Technologies et Mesures, Thales Research &
Abstract :
This paper presents a thin film metallic membrane (~1μm) capacitive RF-MEMS shunt switch with a power handling of more than 20 W for X-Band applications. The device switching time is below 15 μs, in cold switching, for a 60 V applied voltage. The up-state capacitance is 40 fF, resulting in a less than 0.1 dB insertion losses at 10 GHz, simulated. The down-state capacitance, estimated at 3.1 pF, including the parasitic air capacitance from the surface roughness, results in a 77 capacitance ration for about 30 dB isolation, simulated. Measurements show up to a million cycles with no degradation on performances under 20W incident power in cold switching.
Keywords :
"Optical switches","Radio frequency","Substrates","Capacitance","Atmospheric measurements","Temperature measurement"
Conference_Titel :
Solid State Device Research Conference (ESSDERC), 2015 45th European
Print_ISBN :
978-1-4673-7133-9
Electronic_ISBN :
2378-6558
DOI :
10.1109/ESSDERC.2015.7324736