Title :
Simulated shunts as dc low-resistance travelling standards
Author :
Luca Callegaro;Cristina Cassiago;Enrico Gasparotto
Author_Institution :
Istituto Nazionale di Ricerca Metrologica (INRIM), Strada delle Cacce 91, 10135 Torino, Italy
Abstract :
We introduce a device that simulates a low-valued resistance standard (shunt) that can be employed as a metrology-grade travelling standard, for the traceability transfer of dc resistance in the low range, and in laboratory intercomparisons. The device is composed of a direct-current current comparator (DCCT) and a mid-range resistance standard. A prototype having a nominal resistance of 10m Ω has been constructed. Experiments show that it can be measured with high-accuracy commercial dc resistance bridges in their default operating configurations. The power coefficient is much lower than a corresponding shunt of the same nominal resistance. The expected long-term and transport stability is a few parts in 106 or better.
Keywords :
"Standards","Resistance","Resistors","Electrical resistance measurement","Current measurement","Ports (Computers)","Bridges"
Conference_Titel :
Research and Technologies for Society and Industry Leveraging a better tomorrow (RTSI), 2015 IEEE 1st International Forum on
DOI :
10.1109/RTSI.2015.7325115