Title :
Sensitivity of C-band backscatter to surface roughness parameters measured at different scales
Author :
Alex Martínez-Agirre;Jesús Álvarez-Mozos;Hans Lievens;Niko E. C. Verhoest;Rafael Giménez
Author_Institution :
Public University of Navarre, Department of Projects and Rural Engineering, Los Olivos, Arrosadia, 31006, Pamplona, Spain
fDate :
7/1/2015 12:00:00 AM
Abstract :
SAR (Synthetic Aperture Radar) sensors measure the backscatter (a0) of land covers and SAR images have a number of applications in agricultural soils (soil moisture, crop monitoring, etc.) but the surface roughness of these soils complicates their interpretation and determination of quantitative estimates of useful parameters. The aim of this study is to quantify the spatial variability of different roughness parameters and the sensitivity of a0 to them measured at different scales. Ten Envisat/ASAR images acquired between September 2004 and January 2005 on an agricultural area with 10 control plots are analyzed. 132 roughness profiles of 5 m length were measured, and 21 different parameters were calculated. The results show considerable differences in the spatial variability of the parameters and differed depending on the type of parameter in the correlation analysis. This study can be useful to identify roughness parameters and scales that maximize their sensitivity to C-band backscatter.
Keywords :
"Rough surfaces","Surface roughness","Soil","Correlation","Sensitivity","Synthetic aperture radar","Fractals"
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2015 IEEE International
Electronic_ISBN :
2153-7003
DOI :
10.1109/IGARSS.2015.7325860