Title :
TanDEM-X DSM uncertainty measures and demonstrations
Author :
Cristian Rossi;Thomas Fritz;Michael Eineder
Author_Institution :
German Aerospace Center (DLR), Remote Sensing Technology Institute, Wessling, Germany
fDate :
7/1/2015 12:00:00 AM
Abstract :
SAR interferometry is a well-known technique to produce digital surface models (DSM). In the global scale, the quality of these models significantly increased with the use of bistatic systems as for the TanDEM-X mission. DSM uncertainty can be measured in two scales: a global and a local one. A global scale analysis involves measures for the complete take, characterizing the whole correctness with a single parameter. A local scale analysis enters instead in the single elevation model cell, evaluating the quality obtained by different terrains and media present in the take. A coherence analysis is a typical measure for InSAR models. Globally, a simple average gives an overall quality measure hint. Locally, it provides a measure of the DSM pixel height error. Unfortunately, this measure lacks in several aspects as not considering unwrapping errors and not being valid for certain types of scattering. In this paper, various strategies for assessing elevation accuracy methods and demonstrate the different capabilities of the bistatic TanDEM-X system are proposed for variegated terrain types.
Keywords :
"Uncertainty","Accuracy","Measurement uncertainty","Remote sensing","Distortion measurement","Buildings","Distortion"
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2015 IEEE International
Electronic_ISBN :
2153-7003
DOI :
10.1109/IGARSS.2015.7326659