DocumentCode
3690822
Title
TanDEM-X DSM uncertainty measures and demonstrations
Author
Cristian Rossi;Thomas Fritz;Michael Eineder
Author_Institution
German Aerospace Center (DLR), Remote Sensing Technology Institute, Wessling, Germany
fYear
2015
fDate
7/1/2015 12:00:00 AM
Firstpage
3830
Lastpage
3833
Abstract
SAR interferometry is a well-known technique to produce digital surface models (DSM). In the global scale, the quality of these models significantly increased with the use of bistatic systems as for the TanDEM-X mission. DSM uncertainty can be measured in two scales: a global and a local one. A global scale analysis involves measures for the complete take, characterizing the whole correctness with a single parameter. A local scale analysis enters instead in the single elevation model cell, evaluating the quality obtained by different terrains and media present in the take. A coherence analysis is a typical measure for InSAR models. Globally, a simple average gives an overall quality measure hint. Locally, it provides a measure of the DSM pixel height error. Unfortunately, this measure lacks in several aspects as not considering unwrapping errors and not being valid for certain types of scattering. In this paper, various strategies for assessing elevation accuracy methods and demonstrate the different capabilities of the bistatic TanDEM-X system are proposed for variegated terrain types.
Keywords
"Uncertainty","Accuracy","Measurement uncertainty","Remote sensing","Distortion measurement","Buildings","Distortion"
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium (IGARSS), 2015 IEEE International
ISSN
2153-6996
Electronic_ISBN
2153-7003
Type
conf
DOI
10.1109/IGARSS.2015.7326659
Filename
7326659
Link To Document